000 00309nam a2200109Ia 4500
008 230303s9999 xx 000 0 und d
041 _aeng
082 _a004.165 KAP
100 _aLall (Pradeep)
245 _aInfluence of temerature on microelectronics and system reliability
260 _aCRC Press
_bBocaRatan
999 _c180607
_d180607